Chapter 6

Pulsed immunity

Introduction

The pulsed immunity test modules are used to record test data in the RadiMation® software. Some of the pulsed immunity tests are carried out manually while the test engineer enters the test results. The report generator can use the results of the tests.

The following pulsed immunity tests are implemented:

• Electro static discharge (ESD) testing
• Electrical Fast Transient (EFT) testing
• Surge testing
• Voltage dips and interrupts (VDI) testing

ESD testing

Starting an ESD test

Loading a TSF file

To start an ESD test, an EUT file must be defined first. From the EUT file, select

    Tests

       Pulsed immunity

          ESD

A list of Technical Setup Files (TSF files) will be displayed. The test engineer can select one of these TSF files to load all parameters from a previously defined ESD test or press cancel to define a new ESD test.

After the TSF file has been selected, the ESD configuration window will appear.

When a TSF file is loaded, all test parameters will be already configured and pressing the start button on the right side of the screen can start the test.

When a new TSF file is loaded (by pressing New in the TSF selection window) all parameters will be at zero and can be configured by the operator.

The picture below shows the ESD configuration screen.

The operator has to select test levels and pulse polarity. Furthermore the burst waveform has to be configured by the operator. The measurement results can be recorded in the right side of the screen. For each injection mode, the operator can select pass or fail and make notes in the “notes” field. All configurations (except for the test results) can be stored in a TSF file.

EFT testing

Starting a single band EFT test

Loading a TSF file

To start an EFT test, an EUT file must be defined first. From the EUT file, select

    Tests

       Pulsed immunity

          EFT

A list of Technical Setup Files (TSF files) will be displayed. The test engineer can select one of these TSF files to load all parameters from a previously defined EFT test or press cancel to define a new EFT test.

After the TSF file has been selected, the EFT configuration window will appear.

When a TSF file is loaded, all test parameters will be already configured and pressing the start button on the right side of the screen can start the test.

When a new TSF file is loaded (by pressing New in the TSF selection window) all parameters will be at zero and can be configured by the operator.

The picture below shows the EFT configuration screen.

The operator has to select the cable to be tested (AC / DC / IO). The cable under test is part of the EUT so it needs to be configured in the EUT window under cables. Furthermore the burst waveform has to be configured by the operator. The measurement results can be recorded in the right side of the screen. For each injection mode, the operator can select pass or fail and make notes in the “notes” field. All configurations (except for the test results) can be stored in a TSF file.

Cable under test

Selection of cable on which the test is performed. The cable is created in the cable section in the EUT window.

Measurement

Configuration of the tests that need to be performed on the specific cable.

Level

The level applied to the cable.

Note	A note that can be added before performing the test relate.

Pulse Duration

The duration of the pulse applied to the cable.

Pulse Rise time

The rise time of the pulse applied to the cable.

Burst Duration

The duration of the burst applied to the cable.

Burst Repetition rate

The repetition rate of the burst applied to the cable.

Show Pulse Shape

Display a graphical view of the pulse shape.

Performance criteria according to the product standard

In this field the performance criteria according to the standard can be written down.

Performance criteria as described by the customer

In this field the performance criteria as described by the customer can be written down.

Test equipment

In the test site window the test engineer can select which equipment list will be used during this test.

Test engineer

In the test engineer window, the test engineer can select their own name. The test engineer name will be stored by the test results.

Equipment icon

By clicking on the equipment icon, the equipment list can be viewed and edited.

Starting a multiband test

Loading a TSF file

To start an EFT test, an EUT file must be defined first. From the EUT file, select

    Tests

       Pulsed immunity

          EFT Multiband

A list of Technical Setup Files (TSF files) will be displayed. The test engineer can select one of these TSF files to load all parameters from a previously defined EFT test or press cancel to define a new EFT test.

After the TSF file has been selected, the EFT configuration window will appear.

When a TSF file is loaded, all test parameters will be already configured and pressing the start button on the right side of the screen can start the test.

When a new TSF file is loaded (by pressing New in the TSF selection window) all parameters will be at zero and can be configured by the operator.

The picture below shows the EFT Multiband configuration screen.

The operator has to select the cable to be tested (AC / DC / IO). The cable under test is part of the EUT and therefore must be configured in the EUT window under cables.

Within this window, the operator defines the test levels, timing, and coupling line configuration for each EFT sequence. Measurement results can be entered on the right side of the screen, where each test step can be marked as Pass or Fail. All configurations (except for the test results) can be stored in a TSF file for later use.

Cable under test

Selection of the cable on which the EFT test is performed. The cable is defined in the EUT configuration under Cables.

Repeat count

Defines how many times the complete EFT test configuration is executed.

Sequence list

Overview of all EFT test sequences to be performed.

Voltage test level

Specifies the burst voltage level to be applied.

Polarity

Defines whether the burst polarity is positive, negative, or toggling.

Coupling device configuration

Shows the selected coupling device setup.

Line	Shows the selected coupling device.

Add / Duplicate / Remove

Buttons to create, copy, or delete EFT sequences from the list.

Sequence configuration

Defines the test parameters for the currently selected EFT sequence.

Voltage test level

Sets the test voltage level for the EFT burst.

Polarity

Determines if the pulses are positive, negative, or alternating.

Pulse repetition rate

Sets the frequency of the pulses within the burst.

Line

Shows the selected coupling device and is used to opens the Coupling Line Configuration dialog where the operator defines which coupling lines are used for the EFT test. The coupling line Configuration dialog allows the selection of the coupling line configuration for the device driver found in the testsite. The operator can select one or more combinations, depending on the test standard requirements. If no coupling path is selected the pre-existing configuration will not be overwritten. The coupling line configuration dialog does not remember the previous selected line selection. Each selected line is tested sequentially; RadiMation automatically creates individual EFT injections for each configuration. Selecting multiple lines ensures all required coupling paths are tested without manual re-configuration between runs. If no line is selected when starting the test, RadiMation prompts the user to select at least one coupling path before the test can start. When multiple coupling paths are selected, RadiMation automatically performs a separate test for each selection in sequence. The order in which testing on the coupling lines is performed is undefined.

Note:

The coupling configuration dialogue is added in RadiMation 2025.2.1, in older RadiMation releases a single tested coupling line is selected from a predefined list.

Sequence timing

Defines timing values used for the EFT bursts.

Burst Duration

The duration of a single burst of pulses.

Burst Period

The interval between two bursts.

Duration

Total time that the sequence runs.

Repeat count

Number of times the sequence is repeated.

Pulse shape

Displays a visual representation of the EFT pulse and burst waveform.

Test Equipment

Displays the selected test generator or system used for the EFT test.

Test results

Shows the test status (Not tested, Pass, or Fail) and allows the operator to add notes related to the test.

Surge testing

Starting a single band surge test

Loading a TSF file

To start a Surge test, an EUT file must be defined first. From the EUT file, select

    Tests

       Pulsed immunity

          Surge

A list of Technical Setup Files (TSF files) will be displayed. The test engineer can select one of these TSF files to load all parameters from a previously defined emission test or press cancel to define a new surge test.

After the TSF file has been selected, the surge configuration window will appear.

When a TSF file is loaded, all test parameters will be already configured and pressing the start button on the right side of the screen will start the test.

When a new TSF file is loaded (by pressing New in the TSF selection window) all parameters will be at zero and can be configured by the operator.

The picture below shows the surge test configuration screen.

The operator has to select cable to be tested (1 or 3 phase / DC / IO). The cable under test is part of the EUT so it needs to be configured in the EUT window under cables. Furthermore the operator has to configure the test level, polarity, phase and the internal resistor and capacitor of the generator. The measurement results can be recorded in the right side of the screen. For each injection mode, the operator can select pass or fail and make notes in the “notes” field. All configurations (except for the test results) can be stored in a TSF file.

Cable under test

Selection of cable on which the test is performed. The cable is created in the cable section in the EUT window.

Open circuit duration

The duration of the open circuit applied to the cable.

Open circuit rise time

The rise time of the open circuit applied to the cable.

Short circuit duration

The duration of the short circuit applied to the cable.

Short circuit rise time

The rise time of the short circuit applied to the cable.

Performance criteria according to the product standard

In the Performance criteria according to the product standard window the performance criteria according to the standard can be written down.

Performance criteria as described by the customer

In the Performance criteria as described by the customer window the performance criteria as described by the customer can be written down.

Test equipment

In the test site window the test engineer can select which equipment list will be used during this test.

Test engineer

In the test engineer window, the test engineer can select their own name. The test engineer name will be stored by the test results.

Equipment icon

By clicking on the equipment icon, the equipment list can be viewed and edited.

Starting a multiband surge test

Loading a TSF file

To start a surge test, an EUT file must be defined first. From the EUT file, select

    Tests

       Pulsed immunity

          Surge Multiband

A list of Technical Setup Files (TSF files) will be displayed. The test engineer can select one of these TSF files to load all parameters from a previously defined surge test or press cancel to define a new surge test.

After the TSF file has been selected, the surge configuration window will appear.

When a TSF file is loaded, all test parameters will be already configured and pressing the start button on the right side of the screen will start the test.

When a new TSF file is loaded (by pressing New in the TSF selection window) all parameters will be at zero and can be configured by the operator.

The picture below shows the Surge Multiband configuration screen.

The operator must select the cable to be tested (AC / DC / IO), which is part of the EUT configuration under cables. The window allows configuration of voltage level, polarity, coupling network, and phase angles. Measurement results can be recorded on the right side of the screen. For each injection mode, the operator can select Pass or Fail and add remarks in the notes field. All configurations (except for test results) can be saved in a TSF file.

Cable under test

Selection of the cable on which the Surge test is performed. The cable is created in the EUT window under Cables.

Repeat count

Defines how many times the complete Surge test configuration is executed.

Sequence list

Overview of all Surge test sequences to be executed.

Voltage test level

Specifies the voltage amplitude for the surge pulse.

Polarity

Defines whether the surge polarity is positive, negative, or toggling.

Ri / Ci

Defines the internal resistance and capacitance values of the coupling network.

Phase angle

Specifies the mains phase angle(s) at which the surge is applied (0°, 90°, 180°, 270°, or Random).

Coupling device configuration

Shows the coupling device setup (e.g. internal or external).

Line	Shows the selected coupling device.

Add / Duplicate / Remove

Buttons to add, copy, or delete sequences from the list.

Sequence configuration

Defines the Surge test settings for the selected sequence.

Ri	Internal resistance of the coupling network.

Ci	Internal capacitance of the coupling network.

Voltage test level

Sets the surge voltage amplitude.

Polarity

Selects the polarity of the surge pulse.

Phase angle

Defines the phase(s) of the mains voltage at which the surge is triggered.

Line

Shows the selected coupling device and is used to opens the Coupling Line Configuration dialog where the operator defines which coupling lines are used for the Surge test. The coupling line Configuration dialog allows the selection of the coupling line configuration for the device driver found in the testsite. The operator can select one or more combinations, depending on the test standard requirements. If no coupling path is selected the pre-existing configuration will not be overwritten. The coupling line configuration dialog does not remember the previous selected line selection. Each selected line is tested sequentially; RadiMation automatically creates individual EFT injections for each configuration. Selecting multiple lines ensures all required coupling paths are tested without manual re-configuration between runs. If no line is selected when starting the test, RadiMation prompts the user to select at least one coupling path before the test can start. When multiple coupling paths are selected, RadiMation automatically performs a separate test for each selection in sequence. The order in which testing on the coupling lines is performed is undefined.

Note:

The coupling configuration dialogue is added in RadiMation 2025.2.1, in older RadiMation releases a single tested coupling line is selected from a predefined list.

Sequence timing

Defines timing values for surge generation.

Pulse repetition time

Time interval between two consecutive surges.

Pulse count

Number of surges per test sequence.

Repeat count

Number of times the sequence is repeated.

Pulse shape

Displays a graphical representation of the 1.2/50 µs surge waveform showing rise and decay times.

Test Equipment

Shows the selected test system for the Surge test. The configuration button opens the equipment setup dialog.

Test results

Displays the test status (Not tested, Pass, or Fail) and provides a note field for operator comments or observations.

Voltage dips and interrupts testing

Starting a Voltage dips and interrupts test

Loading a TSF file

To start a VDI test, an EUT file must be defined first. From the EUT file, select

    Tests

       Pulsed immunity

          Voltage dips and interrupts

A list of Technical Setup Files (TSF files) will be displayed. The test engineer can select one of these TSF files to load all parameters from a voltage dips and interrupts defined test or press cancel to define a new voltage dips and interrupts test.

After the TSF file has been selected, the voltage dips and interrupts configuration window will appear.

When a TSF file is loaded, all test parameters will be already configured and pressing the start button on the right side of the screen will start the test.

When a new TSF file is loaded (by pressing New in the TSF selection window) all parameters will be at zero and can be configured by the operator.

The picture below shows the voltage dips and interrupts test configuration screen.

The operator has to select cable to be tested (1 or 3 phase / DC / IO). The cable under test is part of the EUT so it needs to be configured in the EUT window under cables. Furthermore the operator has to configure the test level, polarity, phase and the internal resistor and capacitor of the generator. The measurement results can be recorded in the right side of the screen. For each injection mode, the operator can select pass or fail and make notes in the “notes” field. All configurations (except for the test results) can be stored in a TSF file.

Cable

Selection of the mains cable on which this pulsed-immunity test will be applied. The cable is created and managed in the EUT window.

Repeat count

Defines how many times the complete test configuration is executed.

Location type

Defines the supply type for the sequence (AC or DC).

Rated voltage

Nominal supply voltage applied to the EUT during the test.

Changed voltage

Percentage of the rated voltage applied during the dip or interruption.

Phase angle selection

Allows selection of one or more fixed phase angles (0°, 90°, 180°, 270°) or randomized angle triggering.

Line	Selection of the line on which the voltage dip or interruption is applied.

Impedance

Selection of the output impedance level of the generator (Low or High).

Decrease voltage time

Time required for the voltage to ramp down to the reduced level.

Reduced voltage time

Duration for which the reduced voltage level is maintained.

Increase voltage time

Time required for the voltage to ramp back up to rated level.

Repetition time

Total time interval between successive pulses in the sequence.

Dip count

Number of dips generated within this sequence.

Repeat count

How many times this timing sequence is executed within the selected sequence configuration.

Pulse diagram

Graphical representation of the pulse form, showing the timing of the drop, hold, and recovery of voltage during the dip/interrupt event.

Test status

Indicates whether the selected sequence has not been tested, passed, or failed.

Note	Field where the test engineer can enter observations, deviations, or test-related remarks.

Test equipment

Selection of the equipment list to be used for this sequence. The list is defined and maintained in the equipment configuration.

Equipment icon

Opens the equipment list for viewing or editing.

The ability of an EUT to be immune to incoming electromagnetic interference. This is equivalent to the term susceptibility that is used by some standards.

ElectroStatic Discharge

Electrical Fast Transients

Test Setup File

Equipment Under Test

Alternating Current

Direct Current

Input/Output