Chapter 6: Difference between revisions

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==Introduction==
==Introduction==


The pulsed immunity test modules are used to record test data in the RadiMation® software. Some of the pulsed immunity tests are carried out manually while the test engineer enters the test results. The report generator can use the results of the tests.
The pulsed immunity test modules are used to record test data in the RadiMation® software. Most of the pulsed immunity tests are carried out manually while the test engineer enters the test results. The report generator can use the results of the tests.


The following pulsed immunity tests are implemented:
The following pulsed immunity tests are implemented:
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*Electrical Fast Transient (EFT) testing
*Electrical Fast Transient (EFT) testing
*Surge testing
*Surge testing
*Voltage dips and interrupts (VDI) testing
=ESD testing=
==Starting an ESD test==
===Loading a TSF file===
To start an ESD test, an EUT file must be defined first. From the EUT file, select
{{menu|Tests|Pulsed immunity|ESD}}
A list of Technical Setup Files (TSF files) will be displayed. The test engineer can select one of these TSF files to load all parameters from a previously defined ESD test or press cancel to define a new ESD test.
After the TSF file has been selected, the ESD configuration window will appear.
When a TSF file is loaded, all test parameters will be already configured and pressing the start button on the right side of the screen can start the test.
When a new TSF file is loaded (by pressing New in the TSF selection window) all parameters will be at zero and can be configured by the operator.


==ESD testing==


The picture below shows the ESD configuration screen. The operator has to select test levels and pulse polarity. Furthermore the burst waveform has to be configured by the operator. The measurement results can be recorded in the right side of the screen. For each injection mode, the operator can select pass or fail and make notes in the “notes” field.
The picture below shows the ESD configuration screen. The operator has to select test levels and pulse polarity. Furthermore the burst waveform has to be configured by the operator. The measurement results can be recorded in the right side of the screen. For each injection mode, the operator can select pass or fail and make notes in the “notes” field.
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[[Image:Pulsed Immunity ESD Test Setup Window.png]]
[[Image:Pulsed Immunity ESD Test Setup Window.png]]


=EFT testing =
==Starting an ESD test==
 
==Starting a single band EFT test==
===Loading a TSF file===
===Loading a TSF file===


To start an EFT test, an EUT file must be defined first. From the EUT file, select  
To start an ESD test, an EUT file must be defined first. From the EUT file, select  
{{menu|Tests|Pulsed immunity|EFT}}
{{menu|Tests|Pulsed immunity|ESD}}
A list of Technical Setup Files (TSF files) will be displayed. The test engineer can select one of these TSF files to load all parameters from a previously defined EFT test or press cancel to define a new EFT test.
A list of Technical Setup Files (TSF files) will be displayed. The test engineer can select one of these TSF files to load all parameters from a previously defined emission test or press cancel to define a new emission test.


After the TSF file has been selected, the EFT configuration window will appear.
After the TSF file has been selected, the emission configuration window will appear.


When a TSF file is loaded, all test parameters will be already configured and pressing the start button on the right side of the screen can start the test.
When a TSF file is loaded, all test parameters will be already configured and pressing the start button on the right side of the screen can start the test.
Line 49: Line 32:
When a new TSF file is loaded (by pressing New in the TSF selection window) all parameters will be at zero and can be configured by the operator.
When a new TSF file is loaded (by pressing New in the TSF selection window) all parameters will be at zero and can be configured by the operator.


==EFT testing ==


The picture below shows the EFT configuration screen.
The picture below shows the EFT configuration screen. The operator has to select the cable to be tested (AC / DC / IO). The cable under test is part of the EUT so it needs to be configured in the EUT window under [[Chapter_3#EUT Information tab|cables]]. Furthermore the burst waveform has to be configured by the operator. The measurement results can be recorded in the right side of the screen. For each injection mode, the operator can select pass or fail and make notes in the “notes” field.
All configurations (except for the test results) can be stored in a TSF file.


[[Image:Pulsed Immunity EFT Test Setup Window.png]]
[[Image:Pulsed Immunity EFT Test Setup Window.png]]
The operator has to select the cable to be tested (AC / DC / IO). The cable under test is part of the EUT so it needs to be configured in the EUT window under [[Chapter_3#EUT Information tab|cables]]. Furthermore the burst waveform has to be configured by the operator. The measurement results can be recorded in the right side of the screen. For each injection mode, the operator can select pass or fail and make notes in the “notes” field.
All configurations (except for the test results) can be stored in a TSF file.


{{ScreenElementDescription|Cable under test|Selection of cable on which the test is performed. The cable is created in the cable section in the EUT window.}}
{{ScreenElementDescription|Cable under test|Selection of cable on which the test is performed. The cable is created in the cable section in the EUT window.}}
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{{ScreenElementDescription|Show Pulse Shape|Display a graphical view of the pulse shape.}}
{{ScreenElementDescription|Show Pulse Shape|Display a graphical view of the pulse shape.}}
}}
}}


{{ScreenElementDescription|Performance criteria|
{{ScreenElementDescription|Performance criteria|
Line 89: Line 68:
}}
}}


==Starting a multiband test==
==Starting an EFT test==
===Loading a TSF file===
===Loading a TSF file===


To start an EFT test, an EUT file must be defined first. From the EUT file, select  
To start an EFT test, an EUT file must be defined first. From the EUT file, select  
{{menu|Tests|Pulsed immunity|EFT Multiband}}
{{menu|Tests|Pulsed immunity|EFT}}
A list of Technical Setup Files (TSF files) will be displayed. The test engineer can select one of these TSF files to load all parameters from a previously defined EFT test or press cancel to define a new EFT test.
A list of Technical Setup Files (TSF files) will be displayed. The test engineer can select one of these TSF files to load all parameters from a previously defined emission test or press cancel to define a new emission test.


After the TSF file has been selected, the EFT configuration window will appear.
After the TSF file has been selected, the emission configuration window will appear.


When a TSF file is loaded, all test parameters will be already configured and pressing the start button on the right side of the screen can start the test.
When a TSF file is loaded, all test parameters will be already configured and pressing the start button on the right side of the screen can start the test.
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When a new TSF file is loaded (by pressing New in the TSF selection window) all parameters will be at zero and can be configured by the operator.
When a new TSF file is loaded (by pressing New in the TSF selection window) all parameters will be at zero and can be configured by the operator.


==Surge testing==


The picture below shows the '''EFT Multiband configuration''' screen.
The picture below shows the Surge configuration screen. The operator has to select cable to be tested (1 or 3 phase / DC / IO). The cable under test is part of the EUT so it needs to be configured in the EUT window under [[Chapter_3#EUT Information tab|cables]]. Furthermore the operator has to configure the test level, polarity, phase and the internal resistor and capacitor of the generator. The measurement results can be recorded in the right side of the screen. For each injection mode, the operator can select pass or fail and make notes in the “notes” field.
All configurations (except for the test results) can be stored in a TSF file.


[[Image:PI_EFT_MB_CONFIGURATION.png]]
[[Image:Pulsed Immunity Surge Test Setup Window.png]]


The operator has to select the cable to be tested (AC / DC / IO).
{{ScreenElementDescription|Cable under test|Selection of cable on which the test is performed. The cable is created in the cable section in the EUT window.}}
The cable under test is part of the EUT and therefore must be configured in the EUT window under [[Chapter_3#EUT Information tab|cables]].


Within this window, the operator defines the test levels, timing, and coupling line configuration for each EFT sequence.
{{ScreenElementDescription|Pulse shape|
Measurement results can be entered on the right side of the screen, where each test step can be marked as Pass or Fail.
{{ScreenElementDescription|Open circuit duration|The duration of the open circuit applied to the cable.}}
All configurations (except for the test results) can be stored in a TSF file for later use.
{{ScreenElementDescription|Open circuit rise time|The rise time of the open circuit applied to the cable.}}
{{ScreenElementDescription|Short circuit duration|The duration of the short circuit applied to the cable.}}
{{ScreenElementDescription|Short circuit rise time|The rise time of the short circuit applied to the cable.}}
}}


{{ScreenElementDescription|Cable under test|Selection of the cable on which the EFT test is performed. The cable is defined in the EUT configuration under ''Cables''.}}
{{ScreenElementDescription|Performance criteria window|
{{ScreenElementDescription|Performance criteria according to the product standard|In the Performance criteria according to the product standard window the performance criteria according to the standard can be written down. }}
{{ScreenElementDescription|Performance criteria as described by the customer|In the Performance criteria as described by the customer window the performance criteria as described by the customer can be written down. }}
}}


{{ScreenElementDescription|Repeat count|Defines how many times the complete EFT test configuration is executed.}}
{{ScreenElementDescription|Test site|
 
{{ScreenElementDescription|Test equipment|In the test site window the test engineer can select which equipment list will be used during this test.}}
{{ScreenElementDescription|Sequence list|Overview of all EFT test sequences to be performed.}}
{{ScreenElementDescription|Test engineer|In the test engineer window, the test engineer can select their own name. The test engineer name will be stored by the test results.}}
{{ScreenElementDescription|Voltage test level|Specifies the burst voltage level to be applied.}}
{{ScreenElementDescription|Equipment icon|By clicking on the equipment icon, the equipment list can be viewed and edited.}}
{{ScreenElementDescription|Polarity|Defines whether the burst polarity is positive, negative, or toggling.}}
}}
{{ScreenElementDescription|Coupling device configuration|Shows the selected coupling device setup.}}
{{ScreenElementDescription|Line|Shows the selected coupling device.}}
 
{{ScreenElementDescription|Add / Duplicate / Remove|Buttons to create, copy, or delete EFT sequences from the list.}}
 
{{ScreenElementDescription|Sequence configuration|Defines the test parameters for the currently selected EFT sequence.}}
{{ScreenElementDescription|Voltage test level|Sets the test voltage level for the EFT burst.}}
{{ScreenElementDescription|Polarity|Determines if the pulses are positive, negative, or alternating.}}
{{ScreenElementDescription|Pulse repetition rate|Sets the frequency of the pulses within the burst.}}
{{ScreenElementDescription|Line|Shows the selected coupling device and is used to opens the '''Coupling Line Configuration''' dialog where the operator defines which coupling lines are used for the EFT test.
The coupling line Configuration dialog allows the selection of the coupling line configuration for the device driver found in the testsite. 
The operator can select one or more combinations, depending on the test standard requirements. 
If no coupling path is selected the pre-existing configuration will not be overwritten.
The coupling line configuration dialog does not remember the previous selected line selection.
Each selected line is tested sequentially; RadiMation automatically creates individual EFT injections for each configuration. 
Selecting multiple lines ensures all required coupling paths are tested without manual re-configuration between runs. 
If no line is selected when starting the test, RadiMation prompts the user to select at least one coupling path before the test can start.
When multiple coupling paths are selected, RadiMation automatically performs a separate test for each selection in sequence. 
The order in which testing on the coupling lines is performed is undefined.}}
                                                  [[Image:EFT-Coupling-Configuration.png]]
{{Note|The coupling configuration dialogue is added in RadiMation 2025.2.1, in older RadiMation releases a single tested coupling line is selected from a predefined list.}}
 
 
{{ScreenElementDescription|Sequence timing|Defines timing values used for the EFT bursts.}}
{{ScreenElementDescription|Burst Duration|The duration of a single burst of pulses.}}
{{ScreenElementDescription|Burst Period|The interval between two bursts.}}
{{ScreenElementDescription|Duration|Total time that the sequence runs.}}
{{ScreenElementDescription|Repeat count|Number of times the sequence is repeated.}}
 
{{ScreenElementDescription|Pulse shape|Displays a visual representation of the EFT pulse and burst waveform.}}
 
{{ScreenElementDescription|Test Equipment|Displays the selected test generator or system used for the EFT test.}}
 
{{ScreenElementDescription|Test results|Shows the test status (Not tested, Pass, or Fail) and allows the operator to add notes related to the test.}}


=Surge testing=
==Starting an Surge test==
==Starting a single band surge test==
===Loading a TSF file===
===Loading a TSF file===


To start a Surge test, an EUT file must be defined first. From the EUT file, select  
To start a Surge test, an EUT file must be defined first. From the EUT file, select  
{{menu|Tests|Pulsed immunity|Surge}}
{{menu|Tests|Pulsed immunity|Surge}}
A list of Technical Setup Files (TSF files) will be displayed. The test engineer can select one of these TSF files to load all parameters from a previously defined emission test or press cancel to define a new surge test.
A list of Technical Setup Files (TSF files) will be displayed. The test engineer can select one of these TSF files to load all parameters from a previously defined emission test or press cancel to define a new emission test.


After the TSF file has been selected, the surge configuration window will appear.
After the TSF file has been selected, the emission configuration window will appear.


When a TSF file is loaded, all test parameters will be already configured and pressing the start button on the right side of the screen will start the test.
When a TSF file is loaded, all test parameters will be already configured and pressing the start button on the right side of the screen will start the test.


When a new TSF file is loaded (by pressing New in the TSF selection window) all parameters will be at zero and can be configured by the operator.
When a new TSF file is loaded (by pressing New in the TSF selection window) all parameters will be at zero and can be configured by the operator.
The picture below shows the surge test configuration screen.
[[Image:Pulsed Immunity Surge Test Setup Window.png]]
The operator has to select cable to be tested (1 or 3 phase / DC / IO). The cable under test is part of the EUT so it needs to be configured in the EUT window under [[Chapter_3#EUT Information tab|cables]]. Furthermore the operator has to configure the test level, polarity, phase and the internal resistor and capacitor of the generator. The measurement results can be recorded in the right side of the screen. For each injection mode, the operator can select pass or fail and make notes in the “notes” field.
All configurations (except for the test results) can be stored in a TSF file.
=Voltage dips and interrupts testing=
==Starting a Voltage dips and interrupts test==
===Loading a TSF file===
To start a VDI test, an EUT file must be defined first. From the EUT file, select
{{menu|Tests|Pulsed immunity|Voltage dips and interrupts}}
A list of Technical Setup Files (TSF files) will be displayed. The test engineer can select one of these TSF files to load all parameters from a voltage dips and interrupts defined test or press cancel to define a new voltage dips and interrupts test.
After the TSF file has been selected, the voltage dips and interrupts configuration window will appear.
When a TSF file is loaded, all test parameters will be already configured and pressing the start button on the right side of the screen will start the test.
When a new TSF file is loaded (by pressing New in the TSF selection window) all parameters will be at zero and can be configured by the operator.
The picture below shows the voltage dips and interrupts test configuration screen.
[[Image:PI_VDI_MB_CONFIGURATION.png]]
The operator has to select cable to be tested (1 or 3 phase / DC / IO). The cable under test is part of the EUT so it needs to be configured in the EUT window under [[Chapter_3#EUT Information tab|cables]]. Furthermore the operator has to configure the test level, polarity, phase and the internal resistor and capacitor of the generator. The measurement results can be recorded in the right side of the screen. For each injection mode, the operator can select pass or fail and make notes in the “notes” field.
All configurations (except for the test results) can be stored in a TSF file.
{{ScreenElementDescription|Cable|Selection of the mains cable on which this pulsed-immunity test will be applied. The cable is created and managed in the EUT window.}}
{{ScreenElementDescription|Repeat count|Defines how many times the complete test configuration is executed.}}
{{ScreenElementDescription|Location type|Defines the supply type for the sequence (AC or DC).}}
{{ScreenElementDescription|Rated voltage|Nominal supply voltage applied to the EUT during the test.}}
{{ScreenElementDescription|Changed voltage|Percentage of the rated voltage applied during the dip or interruption.}}
{{ScreenElementDescription|Phase angle selection|Allows selection of one or more fixed phase angles (0°, 90°, 180°, 270°) or randomized angle triggering.}}
{{ScreenElementDescription|Line|Selection of the line on which the voltage dip or interruption is applied.}}
{{ScreenElementDescription|Impedance|Selection of the output impedance level of the generator (Low or High).}}
{{ScreenElementDescription|Decrease voltage time|Time required for the voltage to ramp down to the reduced level.}}
{{ScreenElementDescription|Reduced voltage time|Duration for which the reduced voltage level is maintained.}}
{{ScreenElementDescription|Increase voltage time|Time required for the voltage to ramp back up to rated level.}}
{{ScreenElementDescription|Repetition time|Total time interval between successive pulses in the sequence.}}
{{ScreenElementDescription|Dip count|Number of dips generated within this sequence.}}
{{ScreenElementDescription|Repeat count|How many times this timing sequence is executed within the selected sequence configuration.}}
{{ScreenElementDescription|Pulse diagram|Graphical representation of the pulse form, showing the timing of the drop, hold, and recovery of voltage during the dip/interrupt event.}}
{{ScreenElementDescription|Test status|Indicates whether the selected sequence has not been tested, passed, or failed.}}
{{ScreenElementDescription|Note|Field where the test engineer can enter observations, deviations, or test-related remarks.}}
{{ScreenElementDescription|Test equipment|Selection of the equipment list to be used for this sequence. The list is defined and maintained in the equipment configuration.}}
{{ScreenElementDescription|Equipment icon|Opens the equipment list for viewing or editing.}}


[[Category:Manual]]
[[Category:Manual]]

Revision as of 11:25, 24 November 2025

Pulsed immunity[edit]

Introduction[edit]

The pulsed immunity test modules are used to record test data in the RadiMation® software. Most of the pulsed immunity tests are carried out manually while the test engineer enters the test results. The report generator can use the results of the tests.

The following pulsed immunity tests are implemented:

  • Electro static discharge (ESD) testing
  • Electrical Fast Transient (EFT) testing
  • Surge testing

ESD testing[edit]

The picture below shows the ESD configuration screen. The operator has to select test levels and pulse polarity. Furthermore the burst waveform has to be configured by the operator. The measurement results can be recorded in the right side of the screen. For each injection mode, the operator can select pass or fail and make notes in the “notes” field. All configurations (except for the test results) can be stored in a TSF file.

Pulsed Immunity ESD Test Setup Window.png

Starting an ESD test[edit]

Loading a TSF file[edit]

To start an ESD test, an EUT file must be defined first. From the EUT file, select

   Menu.svg Tests
      Menu.svg Pulsed immunity
         Menu.svg ESD

A list of Technical Setup Files (TSF files) will be displayed. The test engineer can select one of these TSF files to load all parameters from a previously defined emission test or press cancel to define a new emission test.

After the TSF file has been selected, the emission configuration window will appear.

When a TSF file is loaded, all test parameters will be already configured and pressing the start button on the right side of the screen can start the test.

When a new TSF file is loaded (by pressing New in the TSF selection window) all parameters will be at zero and can be configured by the operator.

EFT testing[edit]

The picture below shows the EFT configuration screen. The operator has to select the cable to be tested (AC / DC / IO). The cable under test is part of the EUT so it needs to be configured in the EUT window under cables. Furthermore the burst waveform has to be configured by the operator. The measurement results can be recorded in the right side of the screen. For each injection mode, the operator can select pass or fail and make notes in the “notes” field. All configurations (except for the test results) can be stored in a TSF file.

Pulsed Immunity EFT Test Setup Window.png

ScreenElementDescription.svg Cable under test Selection of cable on which the test is performed. The cable is created in the cable section in the EUT window.
ScreenElementDescription.svg Measurement Configuration of the tests that need to be performed on the specific cable.
ScreenElementDescription.svg Level The level applied to the cable.
ScreenElementDescription.svg Note A note that can be added before performing the test relate.
ScreenElementDescription.svg Pulse shape These parameters describe the characteristics of the applied pulses.
ScreenElementDescription.svg Pulse Duration The duration of the pulse applied to the cable.
ScreenElementDescription.svg Pulse Rise time The rise time of the pulse applied to the cable.
ScreenElementDescription.svg Burst Duration The duration of the burst applied to the cable.
ScreenElementDescription.svg Burst Repetition rate The repetition rate of the burst applied to the cable.
ScreenElementDescription.svg Show Pulse Shape Display a graphical view of the pulse shape.
ScreenElementDescription.svg Performance criteria
ScreenElementDescription.svg Performance criteria according to the product standard In this field the performance criteria according to the standard can be written down.
ScreenElementDescription.svg Performance criteria as described by the customer In this field the performance criteria as described by the customer can be written down.
ScreenElementDescription.svg Test site
ScreenElementDescription.svg Test equipment In the test site window the test engineer can select which equipment list will be used during this test.
ScreenElementDescription.svg Test engineer In the test engineer window, the test engineer can select their own name. The test engineer name will be stored by the test results.
ScreenElementDescription.svg Equipment icon By clicking on the equipment icon, the equipment list can be viewed and edited.

Starting an EFT test[edit]

Loading a TSF file[edit]

To start an EFT test, an EUT file must be defined first. From the EUT file, select

   Menu.svg Tests
      Menu.svg Pulsed immunity
         Menu.svg EFT

A list of Technical Setup Files (TSF files) will be displayed. The test engineer can select one of these TSF files to load all parameters from a previously defined emission test or press cancel to define a new emission test.

After the TSF file has been selected, the emission configuration window will appear.

When a TSF file is loaded, all test parameters will be already configured and pressing the start button on the right side of the screen can start the test.

When a new TSF file is loaded (by pressing New in the TSF selection window) all parameters will be at zero and can be configured by the operator.

Surge testing[edit]

The picture below shows the Surge configuration screen. The operator has to select cable to be tested (1 or 3 phase / DC / IO). The cable under test is part of the EUT so it needs to be configured in the EUT window under cables. Furthermore the operator has to configure the test level, polarity, phase and the internal resistor and capacitor of the generator. The measurement results can be recorded in the right side of the screen. For each injection mode, the operator can select pass or fail and make notes in the “notes” field. All configurations (except for the test results) can be stored in a TSF file.

Pulsed Immunity Surge Test Setup Window.png

ScreenElementDescription.svg Cable under test Selection of cable on which the test is performed. The cable is created in the cable section in the EUT window.
ScreenElementDescription.svg Pulse shape
ScreenElementDescription.svg Open circuit duration The duration of the open circuit applied to the cable.
ScreenElementDescription.svg Open circuit rise time The rise time of the open circuit applied to the cable.
ScreenElementDescription.svg Short circuit duration The duration of the short circuit applied to the cable.
ScreenElementDescription.svg Short circuit rise time The rise time of the short circuit applied to the cable.
ScreenElementDescription.svg Performance criteria window
ScreenElementDescription.svg Performance criteria according to the product standard In the Performance criteria according to the product standard window the performance criteria according to the standard can be written down.
ScreenElementDescription.svg Performance criteria as described by the customer In the Performance criteria as described by the customer window the performance criteria as described by the customer can be written down.
ScreenElementDescription.svg Test site
ScreenElementDescription.svg Test equipment In the test site window the test engineer can select which equipment list will be used during this test.
ScreenElementDescription.svg Test engineer In the test engineer window, the test engineer can select their own name. The test engineer name will be stored by the test results.
ScreenElementDescription.svg Equipment icon By clicking on the equipment icon, the equipment list can be viewed and edited.

Starting an Surge test[edit]

Loading a TSF file[edit]

To start a Surge test, an EUT file must be defined first. From the EUT file, select

   Menu.svg Tests
      Menu.svg Pulsed immunity
         Menu.svg Surge

A list of Technical Setup Files (TSF files) will be displayed. The test engineer can select one of these TSF files to load all parameters from a previously defined emission test or press cancel to define a new emission test.

After the TSF file has been selected, the emission configuration window will appear.

When a TSF file is loaded, all test parameters will be already configured and pressing the start button on the right side of the screen will start the test.

When a new TSF file is loaded (by pressing New in the TSF selection window) all parameters will be at zero and can be configured by the operator.

The ability of an EUT to be immune to incoming electromagnetic interference. This is equivalent to the term susceptibility that is used by some standards.

ElectroStatic Discharge

Electrical Fast Transients

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